Daily Papers

Understanding the brain increasingly depends on integrating evidence across scales, modalities, and disciplines. Addressing a single research question therefore requires a coordinated sequence of operations, from surveying prior work to executing analyses and interpreting results in light of domain knowledge. AI agents promise to accelerate this process, but current agents lack domain expertise in brain science, may fabricate claims, drift during multi-step reasoning, and offer few defined points for expert intervention. These failures are especially costly in brain science, where conclusions feed into downstream scientific claims and depend on laboratory-specific expertise and careful human judgment. We present BrainPilot a fully open-source multi-agent system that accelerates brain science research with traceable logs and agent-verified results. A principal investigator (PI) agent coordinates specialist agents grounded in curated domain knowledge: a unified brain science knowledge base containing 7{,}233 indexed items and a skill library of 72 reusable methodology units across seven research domains. Every major step is recorded in the Graph of Trace, an auditable record that links subgoals, tool use, evidence, and claims and allows researchers to follow and inspect the workflow. An Auditor agent further integrates fabrication checking into the workflow. For evaluation, we run three brain science tasks from Agents' Last Exam, introduce our own benchmark, BrainPilotBench-v0, and present additional end-to-end case studies. Across these evaluations, BrainPilot with an open-source backbone model attains performance comparable to state-of-the-art agent framework with less costs.

This paper introduces KnowHalu, a novel approach for detecting hallucinations in text generated by large language models (LLMs), utilizing step-wise reasoning, multi-formulation query, multi-form knowledge for factual checking, and fusion-based detection mechanism. As LLMs are increasingly applied across various domains, ensuring that their outputs are not hallucinated is critical. Recognizing the limitations of existing approaches that either rely on the self-consistency check of LLMs or perform post-hoc fact-checking without considering the complexity of queries or the form of knowledge, KnowHalu proposes a two-phase process for hallucination detection. In the first phase, it identifies non-fabrication hallucinations--responses that, while factually correct, are irrelevant or non-specific to the query. The second phase, multi-form based factual checking, contains five key steps: reasoning and query decomposition, knowledge retrieval, knowledge optimization, judgment generation, and judgment aggregation. Our extensive evaluations demonstrate that KnowHalu significantly outperforms SOTA baselines in detecting hallucinations across diverse tasks, e.g., improving by 15.65% in QA tasks and 5.50% in summarization tasks, highlighting its effectiveness and versatility in detecting hallucinations in LLM-generated content.

As LLM-based agents increasingly operate in multi-agent systems, understanding adversarial manipulation becomes critical for defensive design. We present a systematic study of intentional deception as an engineered capability, using LLM-to-LLM interactions within a text-based RPG where parameterized behavioral profiles (9 alignments x 4 motivations, yielding 36 profiles with explicit ethical ground truth) serve as our experimental testbed. Unlike accidental deception from misalignment, we investigate a two-stage system that infers target agent characteristics and generates deceptive responses steering targets toward actions counter to their beliefs and motivations. We find that deceptive intervention produces differential effects concentrated in specific behavioral profiles rather than distributed uniformly, and that 88.5% of successful deceptions employ misdirection (true statements with strategic framing) rather than fabrication, indicating fact-checking defenses would miss the large majority of adversarial responses. Motivation, inferable at 98%+ accuracy, serves as the primary attack vector, while belief systems remain harder to identify (49% inference ceiling) or exploit. These findings identify which agent profiles require additional safeguards and suggest that current fact-verification approaches are insufficient against strategically framed deception.

Quality control is of vital importance during electronics production. As the methods of producing electronic circuits improve, there is an increasing chance of solder defects during assembling the printed circuit board (PCB). Many technologies have been incorporated for inspecting failed soldering, such as X-ray imaging, optical imaging, and thermal imaging. With some advanced algorithms, the new technologies are expected to control the production quality based on the digital images. However, current algorithms sometimes are not accurate enough to meet the quality control. Specialists are needed to do a follow-up checking. For automated X-ray inspection, joint of interest on the X-ray image is located by region of interest (ROI) and inspected by some algorithms. Some incorrect ROIs deteriorate the inspection algorithm. The high dimension of X-ray images and the varying sizes of image dimensions also challenge the inspection algorithms. On the other hand, recent advances on deep learning shed light on image-based tasks and are competitive to human levels. In this paper, deep learning is incorporated in X-ray imaging based quality control during PCB quality inspection. Two artificial intelligence (AI) based models are proposed and compared for joint defect detection. The noised ROI problem and the varying sizes of imaging dimension problem are addressed. The efficacy of the proposed methods are verified through experimenting on a real-world 3D X-ray dataset. By incorporating the proposed methods, specialist inspection workload is largely saved.

Self-improving AI agents are designed to learn from their mistakes. We show they can also hallucinate mistakes that never happened. We study this failure mode in automated harness optimization, where an LLM-based proposer edits an agent's scaffold, including prompts, parsers, filters, validators and guardrails, to eliminate observed failures. But this process rarely asks first: was there a real failure to fix? We introduce the Counterfactual Fabrication Lab, a deterministic micro-lab where the correct action is known: do nothing. The lab plants a candidate guardrail for a failure class that provably never occurs, presents only legal episodes, and uses a byte-exact oracle to check every cited violation. The proposer behaves as expected on real violations and abstains on featureless legal input. Yet when the legal input contains a harmless pattern resembling a familiar game rule, it invents a failure: in 15/60 runs, versus 0/60 on featureless input, it enables the nonexistent-rule guardrail and cites a violation the oracle refutes. The effect is structured, not indiscriminate. In single-shot proposals it appears only when three conditions coincide: a rule-shaped pattern, an open-ended rule set and an instruction that presupposes failures. Removing any of these conditions eliminates the fabrication. Because the invented guardrail changes no true outcome and cannot improve an already-perfect suppression score, the phenomenon is neither reward hacking nor over-refusal. It is a phantom guardrail: a fix for a failure that never happened, invisible to suppression-only acceptance. Inside an add-only accept loop it re-enters even without the failure-presupposing instruction, the loop's keep-adding role supplying the demand the instruction supplied in single shot, and once in it stays. We present the Counterfactual Fabrication Lab for measuring fabricated failures in self-improving agent harnesses.

In industrial anomaly detection (IAD), accurately identifying defects amidst diverse anomalies and under varying imaging conditions remains a significant challenge. Traditional approaches often struggle with high false-positive rates, frequently misclassifying normal shadows and surface deformations as defects, an issue that becomes particularly pronounced in products with complex and intricate surface features. To address these challenges, we introduce PA-CLIP, a zero-shot anomaly detection method that reduces background noise and enhances defect detection through a pseudo-anomaly-based framework. The proposed method integrates a multiscale feature aggregation strategy for capturing detailed global and local information, two memory banks for distinguishing background information, including normal patterns and pseudo-anomalies, from true anomaly features, and a decision-making module designed to minimize false positives caused by environmental variations while maintaining high defect sensitivity. Demonstrated on the MVTec AD and VisA datasets, PA-CLIP outperforms existing zero-shot methods, providing a robust solution for industrial defect detection.

Parts manufactured with Fused Deposition Modeling (FDM) often require Design for Additive Manufacturing (DFAM) modifications to ensure printability, structural integrity, and reduced post-processing. Current slicers identify defects such as steep overhangs but are unable to modify the underlying geometry. This work presents AgentsCAD, a multi-agent system that bridges raw boundary-representation (B-Rep) geometry and Large Language Model (LLM) reasoning to automate targeted DFM. The workflow begins by parsing a STEP file. The agentic system detects overhangs above a 45°threshold, constructs a face-adjacency topology graph, and optionally injects semantic feature labels from a GraphSAGE model trained on MFCAD++ (59,665 parts), before dispatching a Claude Sonnet design-reasoning agent that recommends reorientations, fillets, chamfers, and similar modifications. A GPT-4o vision-language verifier inspects rendered views to confirm geometric integrity. Outputs include a modified STEP file and a human-readable report. A test case on a birdhouse model demonstrates that the system correctly diagnoses overhangs, selects appropriate defect mitigation strategies, and proposes physically valid corrections, partially solving the geometry-to-language translation problem central to LLM-driven CAD modification.

Industrial visual sim-to-real is often described as transferring from synthetic images to real images, but industrial deployment usually involves a broader mismatch between available evidence and required decisions. A system may be built from CAD renderings, simulated RGB-D observations, normal reference images, synthetic defects, pretrained feature spaces, or language prompts, yet deployed under different sensors, lighting, materials, fixtures, calibration, production variation, and rare defect modes. This review reframes industrial visual sim-to-real as a domain-gap problem organized by prior availability. We distinguish CAD-available settings, where explicit object geometry can support rendering, calibration, pose estimation, segmentation, and test-time geometric verification; CAD-unavailable settings, where geometry is replaced by normal-reference appearance, feature distributions, teacher-student residuals, synthetic anomaly assumptions, foundation features, or vision-language priors; and boundary-prior settings, where approximate models, templates, reference views, or semantic correspondences preserve only part of the CAD role. This framing connects CAD-based detection and 6D pose-estimation literature with industrial anomaly and surface-inspection literature that is usually reviewed separately. To make the taxonomy concrete, we use empirical anchors on T-LESS/BOP, MVTec AD, and VisA. The anchors show that CAD render count alone does not close transfer; source-distribution design, detector capacity, and small real calibration can matter more. They also show that CAD at test time creates a distinct verification channel through mask, pose, and depth consistency, whereas CAD-unavailable inspection relies on calibrated normality and feature deviation. The review therefore argues against a single cross-task leaderboard and instead asks what prior grounds the deployment decision.

In industrial settings, surface defects on steel can significantly compromise its service life and elevate potential safety risks. Traditional defect detection methods predominantly rely on manual inspection, which suffers from low efficiency and high costs. Although automated defect detection approaches based on Convolutional Neural Networks(e.g., Mask R-CNN) have advanced rapidly, their reliability remains challenged due to data annotation uncertainties during deep model training and overfitting issues. These limitations may lead to detection deviations when processing the given new test samples, rendering automated detection processes unreliable. To address this challenge, we first evaluate the detection model's practical performance through calibration data that satisfies the independent and identically distributed (i.i.d) condition with test data. Specifically, we define a loss function for each calibration sample to quantify detection error rates, such as the complement of recall rate and false discovery rate. Subsequently, we derive a statistically rigorous threshold based on a user-defined risk level to identify high-probability defective pixels in test images, thereby constructing prediction sets (e.g., defect regions). This methodology ensures that the expected error rate (mean error rate) on the test set remains strictly bounced by the predefined risk level. Additionally, we observe a negative correlation between the average prediction set size and the risk level on the test set, establishing a statistically rigorous metric for assessing detection model uncertainty. Furthermore, our study demonstrates robust and efficient control over the expected test set error rate across varying calibration-to-test partitioning ratios, validating the method's adaptability and operational effectiveness.

Precise optical inspection in industrial applications is crucial for minimizing scrap rates and reducing the associated costs. Besides merely detecting if a product is anomalous or not, it is crucial to know the distinct type of defect, such as a bent, cut, or scratch. The ability to recognize the "exact" defect type enables automated treatments of the anomalies in modern production lines. Current methods are limited to solely detecting whether a product is defective or not without providing any insights on the defect type, nevertheless detecting and identifying multiple defects. We propose MultiADS, a zero-shot learning approach, able to perform Multi-type Anomaly Detection and Segmentation. The architecture of MultiADS comprises CLIP and extra linear layers to align the visual- and textual representation in a joint feature space. To the best of our knowledge, our proposal, is the first approach to perform a multi-type anomaly segmentation task in zero-shot learning. Contrary to the other baselines, our approach i) generates specific anomaly masks for each distinct defect type, ii) learns to distinguish defect types, and iii) simultaneously identifies multiple defect types present in an anomalous product. Additionally, our approach outperforms zero/few-shot learning SoTA methods on image-level and pixel-level anomaly detection and segmentation tasks on five commonly used datasets: MVTec-AD, Visa, MPDD, MAD and Real-IAD.

Given the huge volume of cross-border flows, effective and efficient control of trade becomes more crucial in protecting people and society from illicit trade. However, limited accessibility of the transaction-level trade datasets hinders the progress of open research, and lots of customs administrations have not benefited from the recent progress in data-based risk management. In this paper, we introduce an import declaration dataset to facilitate the collaboration between domain experts in customs administrations and researchers from diverse domains, such as data science and machine learning. The dataset contains 54,000 artificially generated trades with 22 key attributes, and it is synthesized with conditional tabular GAN while maintaining correlated features. Synthetic data has several advantages. First, releasing the dataset is free from restrictions that do not allow disclosing the original import data. The fabrication step minimizes the possible identity risk which may exist in trade statistics. Second, the published data follow a similar distribution to the source data so that it can be used in various downstream tasks. Hence, our dataset can be used as a benchmark for testing the performance of any classification algorithm. With the provision of data and its generation process, we open baseline codes for fraud detection tasks, as we empirically show that more advanced algorithms can better detect fraud.

In this paper, we introduce an approach for detecting modifications in assembled printed circuit boards based on photographs taken without tight control over perspective and illumination conditions. One instance of this problem is the visual inspection of gas pumps PCBs, which can be modified by fraudsters wishing to deceive costumers or evade taxes. Given the uncontrolled environment and the huge number of possible modifications, we address the problem as a case of anomaly detection, proposing an approach that is directed towards the characteristics of that scenario, while being well-suited for other similar applications. The proposed approach employs a deep convolutional autoencoder trained to reconstruct images of an unmodified board, but which remains unable to do the same for images showing modifications. By comparing the input image with its reconstruction, it is possible to segment anomalies and modifications in a pixel-wise manner. Experiments performed on a dataset built to represent real-world situations (and which we will make publicly available) show that our approach outperforms other state-of-the-art approaches for anomaly segmentation in the considered scenario, while producing comparable results on the popular MVTec-AD dataset for a more general object anomaly detection task.

Being able to spot defective parts is a critical component in large-scale industrial manufacturing. A particular challenge that we address in this work is the cold-start problem: fit a model using nominal (non-defective) example images only. While handcrafted solutions per class are possible, the goal is to build systems that work well simultaneously on many different tasks automatically. The best performing approaches combine embeddings from ImageNet models with an outlier detection model. In this paper, we extend on this line of work and propose PatchCore, which uses a maximally representative memory bank of nominal patch-features. PatchCore offers competitive inference times while achieving state-of-the-art performance for both detection and localization. On the challenging, widely used MVTec AD benchmark PatchCore achieves an image-level anomaly detection AUROC score of up to 99.6%, more than halving the error compared to the next best competitor. We further report competitive results on two additional datasets and also find competitive results in the few samples regime.^* Work done during a research internship at Amazon AWS. Code: github.com/amazon-research/patchcore-inspection.

Industry 4.0 has revolutionized manufacturing by driving digitalization and shifting the paradigm toward additive manufacturing (AM). Fused Deposition Modeling (FDM), a key AM technology, enables the creation of highly customized, cost-effective products with minimal material waste through layer-by-layer extrusion, posing a significant challenge to traditional subtractive methods. However, the susceptibility of material extrusion techniques to errors often requires expert intervention to detect and mitigate defects that can severely compromise product quality. While automated error detection and machine learning models exist, their generalizability across diverse 3D printer setups, firmware, and sensors is limited, and deep learning methods require extensive labeled datasets, hindering scalability and adaptability. To address these challenges, we present a process monitoring and control framework that leverages pre-trained Large Language Models (LLMs) alongside 3D printers to detect and address printing defects. The LLM evaluates print quality by analyzing images captured after each layer or print segment, identifying failure modes and querying the printer for relevant parameters. It then generates and executes a corrective action plan. We validated the effectiveness of the proposed framework in identifying defects by comparing it against a control group of engineers with diverse AM expertise. Our evaluation demonstrated that LLM-based agents not only accurately identify common 3D printing errors, such as inconsistent extrusion, stringing, warping, and layer adhesion, but also effectively determine the parameters causing these failures and autonomously correct them without any need for human intervention.

In industrial procurement, an LLM answer is useful only if it survives a standards check: recommended material must match operating condition, every parameter must respect a regulated threshold, and no procedure may contradict a safety clause. Partial correctness can mask safety-critical contradictions that aggregate LLM benchmarks rarely capture. We introduce IndustryBench, a 2,049-item benchmark for industrial procurement QA in Chinese, grounded in Chinese national standards (GB/T) and structured industrial product records, organized by seven capability dimensions, ten industry categories, and panel-derived difficulty tiers, with item-aligned English, Russian, and Vietnamese renderings. Our construction pipeline rejects 70.3% of LLM-generated candidates at a search-based external-verification stage, calibrating how unreliable industrial QA remains after LLM-only filtering.Our evaluation decouples raw correctness, scored by a Qwen3-Max judge validated at κ_w = 0.798 against a domain expert, from a separate safety-violation (SV) check against source texts. Across 17 models in Chinese and an 8-model intersection over four languages, we find: (i) the best system reaches only 2.083 on the 0--3 rubric, leaving substantial headroom; (ii) Standards & Terminology is the most persistent capability weakness and survives item-aligned translation; (iii) extended reasoning lowers safety-adjusted scores for 12 of 13 models, primarily by introducing unsupported safety-critical details into longer final answers; and (iv) safety-violation rates reshuffle the leaderboard -- GPT-5.4 climbs from rank 6 to rank 3 after SV adjustment, while Kimi-k2.5-1T-A32B drops seven positions.Industrial LLM evaluation therefore requires source-grounded, safety-aware diagnosis rather than aggregate accuracy. We release IndustryBench with all prompts, scoring scripts, and dataset documentation.

The convergence of LLM-powered research assistants and AI-based peer review systems creates a critical vulnerability: fully automated publication loops where AI-generated research is evaluated by AI reviewers without human oversight. We investigate this through BadScientist, a framework that evaluates whether fabrication-oriented paper generation agents can deceive multi-model LLM review systems. Our generator employs presentation-manipulation strategies requiring no real experiments. We develop a rigorous evaluation framework with formal error guarantees (concentration bounds and calibration analysis), calibrated on real data. Our results reveal systematic vulnerabilities: fabricated papers achieve acceptance rates up to . Critically, we identify concern-acceptance conflict -- reviewers frequently flag integrity issues yet assign acceptance-level scores. Our mitigation strategies show only marginal improvements, with detection accuracy barely exceeding random chance. Despite provably sound aggregation mathematics, integrity checking systematically fails, exposing fundamental limitations in current AI-driven review systems and underscoring the urgent need for defense-in-depth safeguards in scientific publishing.

Language models in production do not write prose. They fill forms: JSON fields, function arguments, extraction templates. We show that the form itself causes hallucination. We ask thirteen models the same question about the same input and change only the answer format. The inputs are built so the question cannot be answered: a viral post showing 12,400 likes but no visible replies, a support ticket whose call was never transcribed. In free text, GPT-5.5 answers honestly. It says there is no reply data, 98% of the time. Given a required JSON field for sentiment, the same model invents an answer 40 times out of 40. It fabricates the mood of crowds it never saw and quotes customers it never heard. The pattern holds with force. Required fields drive fabrication to 100% in ten of thirteen models. An explicit "insufficient evidence" option rescues only the frontier: all nine open-weight models ignore it. A direct instruction, do not infer sentiment, is overridden by the schema in four of six models. Resistance does not come with scale: within a single model family, the smallest model refuses, the mid-sized model fabricates, the largest refuses again. Honesty under format pressure is a training outcome that no one is measuring. The fabrication hides exactly where hedging is impossible: in required enums and minimum-count arrays, fields where no disclaimer fits. We release PhantomFill, a benchmark with deterministic scoring and two reportable numbers: the Coerced Fabrication Rate and the Escape Utilization Rate. The fix we test is one line of schema. The failure we measure is everywhere.

Outsourced printed circuit board (PCB) fabrication necessitates increased hardware assurance capabilities. Several assurance techniques based on automated optical inspection (AOI) have been proposed that leverage PCB images acquired using digital cameras. We review state-of-the-art AOI techniques and observe a strong, rapid trend toward machine learning (ML) solutions. These require significant amounts of labeled ground truth data, which is lacking in the publicly available PCB data space. We contribute the FICS PCB Image Collection (FPIC) dataset to address this need. Additionally, we outline new hardware security methodologies enabled by our data set.

Surface defects are a primary source of yield loss in manufacturing, yet existing anomaly detection methods often fail in real-world deployment due to limited and unrepresentative datasets. To overcome this, we introduce 3D-ADAM, a 3D Anomaly Detection in Additive Manufacturing dataset, that is the first large-scale, industry-relevant dataset for RGB+3D surface defect detection in additive manufacturing. 3D-ADAM comprises 14,120 high-resolution scans of 217 unique parts, captured with four industrial depth sensors, and includes 27,346 annotated defects across 12 categories along with 27,346 annotations of machine element features in 16 classes. 3D-ADAM is captured in a real industrial environment and as such reflects real production conditions, including variations in part placement, sensor positioning, lighting, and partial occlusion. Benchmarking state-of-the-art models demonstrates that 3D-ADAM presents substantial challenges beyond existing datasets. Validation through expert labelling surveys with industry partners further confirms its industrial relevance. By providing this benchmark, 3D-ADAM establishes a foundation for advancing robust 3D anomaly detection capable of meeting manufacturing demands.

Surface anomaly detection is a vital component in manufacturing inspection. Current discriminative methods follow a two-stage architecture composed of a reconstructive network followed by a discriminative network that relies on the reconstruction output. Currently used reconstructive networks often produce poor reconstructions that either still contain anomalies or lack details in anomaly-free regions. Discriminative methods are robust to some reconstructive network failures, suggesting that the discriminative network learns a strong normal appearance signal that the reconstructive networks miss. We reformulate the two-stage architecture into a single-stage iterative process that allows the exchange of information between the reconstruction and localization. We propose a novel transparency-based diffusion process where the transparency of anomalous regions is progressively increased, restoring their normal appearance accurately while maintaining the appearance of anomaly-free regions using localization cues of previous steps. We implement the proposed process as TRANSparency DifFUSION (TransFusion), a novel discriminative anomaly detection method that achieves state-of-the-art performance on both the VisA and the MVTec AD datasets, with an image-level AUROC of 98.5% and 99.2%, respectively. Code: https://github.com/MaticFuc/ECCV_TransFusion

Anomaly detection is a crucial process in industrial manufacturing and has made significant advancements recently. However, there is a large variance between the data used in the development and the data collected by the production environment. Therefore, we present the Texture-AD benchmark based on representative texture-based anomaly detection to evaluate the effectiveness of unsupervised anomaly detection algorithms in real-world applications. This dataset includes images of 15 different cloth, 14 semiconductor wafers and 10 metal plates acquired under different optical schemes. In addition, it includes more than 10 different types of defects produced during real manufacturing processes, such as scratches, wrinkles, color variations and point defects, which are often more difficult to detect than existing datasets. All anomalous areas are provided with pixel-level annotations to facilitate comprehensive evaluation using anomaly detection models. Specifically, to adapt to diverse products in automated pipelines, we present a new evaluation method and results of baseline algorithms. The experimental results show that Texture-AD is a difficult challenge for state-of-the-art algorithms. To our knowledge, Texture-AD is the first dataset to be devoted to evaluating industrial defect detection algorithms in the real world. The dataset is available at https://XXX.

Anomaly Detection and Segmentation (AD&S) is crucial for industrial quality control. While existing methods excel in generating anomaly scores for each pixel, practical applications require producing a binary segmentation to identify anomalies. Due to the absence of labeled anomalies in many real scenarios, standard practices binarize these maps based on some statistics derived from a validation set containing only nominal samples, resulting in poor segmentation performance. This paper addresses this problem by proposing a test time training strategy to improve the segmentation performance. Indeed, at test time, we can extract rich features directly from anomalous samples to train a classifier that can discriminate defects effectively. Our general approach can work downstream to any AD&S method that provides an anomaly score map as output, even in multimodal settings. We demonstrate the effectiveness of our approach over baselines through extensive experimentation and evaluation on MVTec AD and MVTec 3D-AD.

We present the Open Stamped Parts Dataset (OSPD), featuring synthetic and real images of stamped metal sheets for auto manufacturing. The real part images, captured from 7 cameras, consist of 7,980 unlabeled images and 1,680 labeled images. In addition, we have compiled a defect dataset by overlaying synthetically generated masks on 10\% of the holes. The synthetic dataset replicates the real manufacturing environment in terms of lighting and part placement relative to the cameras. The synthetic data includes 7,980 training images, 1,680 validation images and 1,680 test images, each with bounding box and segmentation mask annotations around all holes. 10\% of the holes in the synthetic data mimic defects generated in the real image dataset. We trained a hole-detection model on the synthetic-OSPD, achieving a modified recall score of 67.2\% and a precision of 94.4\% . We anticipate researchers in auto manufacturing use OSPD to advance the state of the art in defect detection of stamped holes in the metal-sheet stamping process. The dataset is available for download at: https://tinyurl.com/hm6xatd7.

The usage of electronic devices increases, and becomes predominant in most aspects of life. Surface Mount Technology (SMT) is the most common industrial method for manufacturing electric devices in which electrical components are mounted directly onto the surface of a Printed Circuit Board (PCB). Although the expansion of electronic devices affects our lives in a productive way, failures or defects in the manufacturing procedure of those devices might also be counterproductive and even harmful in some cases. It is therefore desired and sometimes crucial to ensure zero-defect quality in electronic devices and their production. While traditional Image Processing (IP) techniques are not sufficient to produce a complete solution, other promising methods like Deep Learning (DL) might also be challenging for PCB inspection, mainly because such methods require big adequate datasets which are missing, not available or not updated in the rapidly growing field of PCBs. Thus, PCB inspection is conventionally performed manually by human experts. Unsupervised Learning (UL) methods may potentially be suitable for PCB inspection, having learning capabilities on the one hand, while not relying on large datasets on the other. In this paper, we introduce ChangeChip, an automated and integrated change detection system for defect detection in PCBs, from soldering defects to missing or misaligned electronic elements, based on Computer Vision (CV) and UL. We achieve good quality defect detection by applying an unsupervised change detection between images of a golden PCB (reference) and the inspected PCB under various setting. In this work, we also present CD-PCB, a synthesized labeled dataset of 20 pairs of PCB images for evaluation of defect detection algorithms.

Internal defect detection constitutes a critical process in ensuring component quality, for which anomaly detection serves as an effective solution. However, existing anomaly detection datasets predominantly focus on surface defects in visible-light images, lacking publicly available X-ray datasets targeting internal defects in components. To address this gap, we construct the first publicly accessible component X-ray anomaly detection (CXR-AD) dataset, comprising real-world X-ray images. The dataset covers five industrial component categories, including 653 normal samples and 561 defect samples with precise pixel-level mask annotations. We systematically analyze the dataset characteristics and identify three major technical challenges: (1) strong coupling between complex internal structures and defect regions, (2) inherent low contrast and high noise interference in X-ray imaging, and (3) significant variations in defect scales and morphologies. To evaluate dataset complexity, we benchmark three state-of-the-art anomaly detection frameworks (feature-based, reconstruction-based, and zero-shot learning methods). Experimental results demonstrate a 29.78% average performance degradation on CXR-AD compared to MVTec AD, highlighting the limitations of current algorithms in handling internal defect detection tasks. To the best of our knowledge, CXR-AD represents the first publicly available X-ray dataset for component anomaly detection, providing a real-world industrial benchmark to advance algorithm development and enhance precision in internal defect inspection technologies.

Misinformation can be countered with fact-checking, but the process is costly and slow. Identifying checkworthy claims is the first step, where automation can help scale fact-checkers' efforts. However, detection methods struggle with content that is 1) multimodal, 2) from diverse domains, and 3) synthetic. We introduce HintsOfTruth, a public dataset for multimodal checkworthiness detection with 27K real-world and synthetic image/claim pairs. The mix of real and synthetic data makes this dataset unique and ideal for benchmarking detection methods. We compare fine-tuned and prompted Large Language Models (LLMs). We find that well-configured lightweight text-based encoders perform comparably to multimodal models but the first only focus on identifying non-claim-like content. Multimodal LLMs can be more accurate but come at a significant computational cost, making them impractical for large-scale applications. When faced with synthetic data, multimodal models perform more robustly

The widespread adoption of deep neural networks (DNNs) requires efficient techniques for verifying their safety. DNN verifiers are complex tools, which might contain bugs that could compromise their soundness and undermine the reliability of the verification process. This concern can be mitigated using proofs: artifacts that are checkable by an external and reliable proof checker, and which attest to the correctness of the verification process. However, such proofs tend to be extremely large, limiting their use in many scenarios. In this work, we address this problem by minimizing proofs of unsatisfiability produced by DNN verifiers. We present algorithms that remove facts which were learned during the verification process, but which are unnecessary for the proof itself. Conceptually, our method analyzes the dependencies among facts used to deduce UNSAT, and removes facts that did not contribute. We then further minimize the proof by eliminating remaining unnecessary dependencies, using two alternative procedures. We implemented our algorithms on top of a proof producing DNN verifier, and evaluated them across several benchmarks. Our results show that our best-performing algorithm reduces proof size by 37%-82% and proof checking time by 30%-88%, while introducing a runtime overhead of 7%-20% to the verification process itself.

We propose claim-level falsification as a principle for test-time scaling and instantiate it through Claim-Level Reliability Assessment (CLR), a training-free framework that reallocates test-time compute from additional solution sampling to targeted verification. Since whole-trace evaluation often obscures decisive errors due to signal dilution from routine tokens, CLR condenses each reasoning trace into a compact set of decision-critical claims, thereby isolating its logical anchors. Furthermore, recognizing the inherent difficulty of generating entirely correct solutions under fixed model capabilities, CLR shifts the focus to semantic falsification. This approach exploits a fundamental asymmetry between solution construction and claim refutation. Constructing a valid solution requires a flawless reasoning path, whereas refuting an incorrect claim requires identifying only a single decisive flaw. This targeted search for negative evidence systematically compresses the survival space of high-confidence incorrect traces, effectively suppressing erroneous consensus via nonlinear reliability scoring. Across four LLMs and four reasoning benchmarks under matched budgets, CLR generally improves upon pass@1 and self-consistency. On GPT-OSS-20B/CMIMC25, for instance, CLR exceeds pass@1 by 27.15 percentage-points and raises self-consistency accuracy from 77.50\% to 82.19\% with 37.0\% fewer tokens.

We present a novel large-scale dataset for defect detection in a logistics setting. Recent work on industrial anomaly detection has primarily focused on manufacturing scenarios with highly controlled poses and a limited number of object categories. Existing benchmarks like MVTec-AD [6] and VisA [33] have reached saturation, with state-of-the-art methods achieving up to 99.9% AUROC scores. In contrast to manufacturing, anomaly detection in retail logistics faces new challenges, particularly in the diversity and variability of object pose and appearance. Leading anomaly detection methods fall short when applied to this new setting. To bridge this gap, we introduce a new benchmark that overcomes the current limitations of existing datasets. With over 230,000 images (and more than 29,000 defective instances), it is 40 times larger than MVTec-AD and contains more than 48,000 distinct objects. To validate the difficulty of the problem, we conduct an extensive evaluation of multiple state-of-the-art anomaly detection methods, demonstrating that they do not surpass 56.96% AUROC on our dataset. Further qualitative analysis confirms that existing methods struggle to leverage normal samples under heavy pose and appearance variation. With our large-scale dataset, we set a new benchmark and encourage future research towards solving this challenging problem in retail logistics anomaly detection. The dataset is available for download under https://www.kaputt-dataset.com.

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial for determining the root cause of production defects, which may further provide insight for yield improvement in wafer foundry. During manufacturing, various defects may appear standalone in the wafer or may appear as different combinations. Identifying multiple defects in a wafer is generally harder compared to identifying a single defect. Recently, deep learning methods have gained significant traction in mixed-type DPR. However, the complexity of defects requires complex and large models making them very difficult to operate on low-memory embedded devices typically used in fabrication labs. Another common issue is the unavailability of labeled data to train complex networks. In this work, we propose an unsupervised training routine to distill the knowledge of complex pre-trained models to lightweight deployment-ready models. We empirically show that this type of training compresses the model without sacrificing accuracy despite being up to 10 times smaller than the teacher model. The compressed model also manages to outperform contemporary state-of-the-art models.

Multimodal automated fact-checking (MAFC) verifies claims by retrieving and reasoning over external evidence. However, most existing static benchmarks risk contamination: they primarily consist of outdated claims verifiable using an LLM's internal knowledge without external evidence. This can inflate performance estimates and fail to reflect true capability on novel claims that require up-to-date information. To address this, emerging dynamic benchmarks collect claims published after LLMs' knowledge cut-off dates, assuming they are uncontaminated. This work revisits this assumption by empirically studying contamination risks in both the state-of-the-art (SOTA) static AVeriTeC benchmark and our newly constructed dynamic ClaimReview2025Q4 benchmark, as well as their impact on MAFC evaluation. Our experiments yield 16 findings, highlighting three key results: (1) Dynamic evaluation reduces but does not eliminate contamination risks, as 17.09\%--29.30\% of post-cut-off claims remain potentially contaminated; (2) Many newly published claims can be verified either directly or by synthesizing multiple pieces of public knowledge available before the cut-off; and (3) Contamination can induce statistically significant inflation in MAFC performance, increasing Macro-F1 by up to 11.34 points and distorting system rankings. In light of these findings, we re-evaluate SOTA LLMs under a strictly contamination-controlled setting. Our study provides practical guidelines for trustworthy MAFC evaluation.

Practitioners make three prompt-design decisions with almost no controlled evidence behind them: how to format instructions and context (markdown, plain text, prose, or tabular), how many simultaneous instructions a system prompt can carry before compliance degrades, and how much context a model can hold before recall and honesty degrade. We report two controlled experiments crossing all three factors on one held, contamination-free synthetic corpus (the "Book of Veyra," 8,780 uniquely-named entities, deterministically regenerable from a fixed seed), evaluated across five models. Experiment 1 (960 calls/model) measures instruction-following decay as rule count N grows from 10 to 160, crossed with four formats and system-prompt vs. user-turn placement. Perfect-response rate collapses to zero by N=80 for every model, format, and placement. Placement produces effects at least as large as format at N=160 in most models, but the direction is model-specific. No model shows a reliable markdown advantage; one 35B model favors plain text instead. Experiment 2 (5,520 calls/model) measures recall accuracy, false-premise sycophancy, and absent-fact fabrication across a 2k-to-512k-token context ladder in the same four formats. Recall stays near ceiling through 64-128k tokens, then degrades sharply and format-dependently: one model's accuracy spread reaches 48 points at 128k tokens. Fabrication never occurs (0/5,760 probes), and sycophancy stays negligible (<=8.3%). What rises sharply near each model's context ceiling is outright refusal to answer (0% to 79-90%), distinct from sycophancy or fabrication. Neither pre-registered format ordering holds, and token overhead (+22% to +37% over plain text) further changes which format is preferable where accuracy spread is genuine. We release the full harness, corpus generator, and raw results (VeyraBench): https://github.com/iNetanel/veyrabench

Industrial visual inspection in pharmaceutical production requires high accuracy under strict constraints on cycle time, hardware footprint, and operational cost. Manual inline inspection is still common, but it is affected by operator variability and limited throughput. Classical rule-based computer vision pipelines are often rigid and difficult to scale to highly variable production scenarios. To address these limitations, we present a semi-supervised anomaly detection framework based on a generative adversarial architecture with a residual autoencoder and a dense bottleneck, specifically designed for online deployment on a high-speed Blow-Fill-Seal (BFS) line. The model is trained only on nominal samples and detects anomalies through reconstruction residuals, providing both classification and spatial localization via heatmaps. The training set contains 2,815,200 grayscale patches. Experiments on a real industrial test kit show high detection performance while satisfying timing constraints compatible with a 500 ms acquisition slot.

Industrial quality inspection plays a critical role in modern manufacturing by identifying defective products during production. While single-modality approaches using either 3D point clouds or 2D RGB images suffer from information incompleteness, multimodal anomaly detection offers promise through the complementary fusion of crossmodal data. However, existing methods face challenges in effectively integrating unimodal results and improving discriminative power. To address these limitations, we first reinterpret memory bank-based anomaly scores in single modalities as isotropic Euclidean distances in local feature spaces. Dynamically evolving from Euclidean metrics, we propose a novel Geometry-Guided Score Fusion (G^{2}SF) framework that progressively learns an anisotropic local distance metric as a unified score for the fusion task. Through a geometric encoding operator, a novel Local Scale Prediction Network (LSPN) is proposed to predict direction-aware scaling factors that characterize first-order local feature distributions, thereby enhancing discrimination between normal and anomalous patterns. Additionally, we develop specialized loss functions and score aggregation strategy from geometric priors to ensure both metric generalization and efficacy. Comprehensive evaluations on the MVTec-3D AD and Eyecandies datasets demonstrate the state-of-the-art detection performance of our method, and detailed ablation analysis validates each component's contribution. Our code is available at https://github.com/ctaoaa/G2SF.

Detecting surface anomalies of industrial materials poses a significant challenge within a myriad of industrial manufacturing processes. In recent times, various methodologies have emerged, capitalizing on the advantages of employing a network pre-trained on natural images for the extraction of representative features. Subsequently, these features are subjected to processing through a diverse range of techniques including memory banks, normalizing flow, and knowledge distillation, which have exhibited exceptional accuracy. This paper revisits approaches based on pre-trained features by introducing a novel method centered on target-specific embedding. To capture the most representative features of the texture under consideration, we employ a variant of a contrastive training procedure that incorporates both artificially generated defective samples and anomaly-free samples during training. Exploiting the intrinsic properties of surfaces, we derived a meaningful representation from the defect-free samples during training, facilitating a straightforward yet effective calculation of anomaly scores. The experiments conducted on the MVTEC AD and TILDA datasets demonstrate the competitiveness of our approach compared to state-of-the-art methods.

Computer-aided design (CAD) is crucial in prototyping 3D objects through geometric instructions (i.e., CAD programs). In practical design workflows, designers often engage in time-consuming reviews and refinements of these prototypes by comparing them with reference images. To bridge this gap, we introduce the CAD review task to automatically detect and correct potential errors, ensuring consistency between the constructed 3D objects and reference images. However, recent advanced multimodal large language models (MLLMs) struggle to recognize multiple geometric components and perform spatial geometric operations within the CAD program, leading to inaccurate reviews. In this paper, we propose the CAD program repairer (ReCAD) framework to effectively detect program errors and provide helpful feedback on error correction. Additionally, we create a dataset, CADReview, consisting of over 20K program-image pairs, with diverse errors for the CAD review task. Extensive experiments demonstrate that our ReCAD significantly outperforms existing MLLMs, which shows great potential in design applications.

Industrial anomaly detection achieves progress thanks to datasets such as MVTec-AD and VisA. However, they suf- fer from limitations in terms of the number of defect sam- ples, types of defects, and availability of real-world scenes. These constraints inhibit researchers from further exploring the performance of industrial detection with higher accuracy. To this end, we propose a new large-scale anomaly detection dataset called 3CAD, which is derived from real 3C produc- tion lines. Specifically, the proposed 3CAD includes eight different types of manufactured parts, totaling 27,039 high- resolution images labeled with pixel-level anomalies. The key features of 3CAD are that it covers anomalous regions of different sizes, multiple anomaly types, and the possibility of multiple anomalous regions and multiple anomaly types per anomaly image. This is the largest and first anomaly de- tection dataset dedicated to 3C product quality control for community exploration and development. Meanwhile, we in- troduce a simple yet effective framework for unsupervised anomaly detection: a Coarse-to-Fine detection paradigm with Recovery Guidance (CFRG). To detect small defect anoma- lies, the proposed CFRG utilizes a coarse-to-fine detection paradigm. Specifically, we utilize a heterogeneous distilla- tion model for coarse localization and then fine localiza- tion through a segmentation model. In addition, to better capture normal patterns, we introduce recovery features as guidance. Finally, we report the results of our CFRG frame- work and popular anomaly detection methods on the 3CAD dataset, demonstrating strong competitiveness and providing a highly challenging benchmark to promote the development of the anomaly detection field. Data and code are available: https://github.com/EnquanYang2022/3CAD.

3D anomaly detection plays a crucial role in monitoring parts for localized inherent defects in precision manufacturing. Embedding-based and reconstruction-based approaches are among the most popular and successful methods. However, there are two major challenges to the practical application of the current approaches: 1) the embedded models suffer the prohibitive computational and storage due to the memory bank structure; 2) the reconstructive models based on the MAE mechanism fail to detect anomalies in the unmasked regions. In this paper, we propose R3D-AD, reconstructing anomalous point clouds by diffusion model for precise 3D anomaly detection. Our approach capitalizes on the data distribution conversion of the diffusion process to entirely obscure the input's anomalous geometry. It step-wisely learns a strict point-level displacement behavior, which methodically corrects the aberrant points. To increase the generalization of the model, we further present a novel 3D anomaly simulation strategy named Patch-Gen to generate realistic and diverse defect shapes, which narrows the domain gap between training and testing. Our R3D-AD ensures a uniform spatial transformation, which allows straightforwardly generating anomaly results by distance comparison. Extensive experiments show that our R3D-AD outperforms previous state-of-the-art methods, achieving 73.4% Image-level AUROC on the Real3D-AD dataset and 74.9% Image-level AUROC on the Anomaly-ShapeNet dataset with an exceptional efficiency.

Surface defect detection is a critical task across numerous industries, aimed at efficiently identifying and localising imperfections or irregularities on manufactured components. While numerous methods have been proposed, many fail to meet industrial demands for high performance, efficiency, and adaptability. Existing approaches are often constrained to specific supervision scenarios and struggle to adapt to the diverse data annotations encountered in real-world manufacturing processes, such as unsupervised, weakly supervised, mixed supervision, and fully supervised settings. To address these challenges, we propose SuperSimpleNet, a highly efficient and adaptable discriminative model built on the foundation of SimpleNet. SuperSimpleNet incorporates a novel synthetic anomaly generation process, an enhanced classification head, and an improved learning procedure, enabling efficient training in all four supervision scenarios, making it the first model capable of fully leveraging all available data annotations. SuperSimpleNet sets a new standard for performance across all scenarios, as demonstrated by its results on four challenging benchmark datasets. Beyond accuracy, it is very fast, achieving an inference time below 10 ms. With its ability to unify diverse supervision paradigms while maintaining outstanding speed and reliability, SuperSimpleNet represents a promising step forward in addressing real-world manufacturing challenges and bridging the gap between academic research and industrial applications. Code: https://github.com/blaz-r/SuperSimpleNet

Large language models often produce plausible numerical claims from financial filings while using the wrong reporting period, unit, line item, or formula. Verifying such claims requires more than rechecking arithmetic: a verifier must ground the relevant facts, establish the authorized calculation, and determine whether the candidate value follows from both. We propose VeriFin, a neurosymbolic verification framework for numerical financial question answering that grounds operands in filed XBRL facts, derives calculations from the question, filing linkbases, or documented metric definitions, and checks claims using Z3. When a claim is inconsistent, solver-derived unsatisfiable cores identify the conflicting facts, formula, and candidate value, enabling targeted repair. We evaluate VeriFin on XBRLFiling, a new 600-question benchmark constructed from 10-K filings of 28 U.S. companies, and on FinanceBench. On fixed candidate pools shared by all verification methods, VeriFin accepts none of the incorrect claims, whereas the baselines accept 6 to 92 incorrect claims on XBRLFiling's 600 claims and 4 to 21 incorrect claims on FinanceBench's 67 claims. The zero false-accept result persists across multiple answer-generator models. Solver-derived feedback further improves repair, achieving up to 69.9% recovery among true catches. These results show that source-grounded symbolic verification can provide a reliable and auditable acceptance control for LLM-generated financial claims.

Logical anomaly detection in industrial inspection remains challenging due to variations in visual appearance (e.g., background clutter, illumination shift, and blur), which often distract vision-centric detectors from identifying rule-level violations. However, existing benchmarks rarely provide controlled settings where logical states are fixed while such nuisance factors vary. To address this gap, we introduce VID-AD, a dataset for logical anomaly detection under vision-induced distraction. It comprises 10 manufacturing scenarios and five capture conditions, totaling 50 one-class tasks and 10,395 images. Each scenario is defined by two logical constraints selected from quantity, length, type, placement, and relation, with anomalies including both single-constraint and combined violations. We further propose a language-based anomaly detection framework that relies solely on text descriptions generated from normal images. Using contrastive learning with positive texts and contradiction-based negative texts synthesized from these descriptions, our method learns embeddings that capture logical attributes rather than low-level features. Extensive experiments demonstrate consistent improvements over baselines across the evaluated settings. The dataset is available at: https://github.com/nkthiroto/VID-AD.

Although recent methods have tried to introduce large multimodal models (LMMs) into industrial anomaly detection (IAD), their generalization in the IAD field is far inferior to that for general purposes. We summarize the main reasons for this gap into two aspects. On one hand, general-purpose LMMs lack cognition of defects in the visual modality, thereby failing to sufficiently focus on defect areas. Therefore, we propose to modify the AnyRes structure of the LLaVA model, providing the potential anomalous areas identified by existing IAD models to the LMMs. On the other hand, existing methods mainly focus on identifying defects by learning defect patterns or comparing with normal samples, yet they fall short of understanding the causes of these defects. Considering that the generation of defects is closely related to the manufacturing process, we propose a manufacturing-driven IAD paradigm. An instruction-tuning dataset for IAD (InstructIAD) and a data organization approach for Chain-of-Thought with manufacturing (CoT-M) are designed to leverage the manufacturing process for IAD. Based on the above two modifications, we present Triad, a novel LMM-based method incorporating an expert-guided region-of-interest tokenizer and manufacturing process for industrial anomaly detection. Extensive experiments show that our Triad not only demonstrates competitive performance against current LMMs but also achieves further improved accuracy when equipped with manufacturing processes. Source code, training data, and pre-trained models will be publicly available at https://github.com/tzjtatata/Triad.

The chips contained in any electronic device are manufactured over circular silicon wafers, which are monitored by inspection machines at different production stages. Inspection machines detect and locate any defect within the wafer and return a Wafer Defect Map (WDM), i.e., a list of the coordinates where defects lie, which can be considered a huge, sparse, and binary image. In normal conditions, wafers exhibit a small number of randomly distributed defects, while defects grouped in specific patterns might indicate known or novel categories of failures in the production line. Needless to say, a primary concern of semiconductor industries is to identify these patterns and intervene as soon as possible to restore normal production conditions. Here we address WDM monitoring as an open-set recognition problem to accurately classify WDM in known categories and promptly detect novel patterns. In particular, we propose a comprehensive pipeline for wafer monitoring based on a Submanifold Sparse Convolutional Network, a deep architecture designed to process sparse data at an arbitrary resolution, which is trained on the known classes. To detect novelties, we define an outlier detector based on a Gaussian Mixture Model fitted on the latent representation of the classifier. Our experiments on a real dataset of WDMs show that directly processing full-resolution WDMs by Submanifold Sparse Convolutions yields superior classification performance on known classes than traditional Convolutional Neural Networks, which require a preliminary binning to reduce the size of the binary images representing WDMs. Moreover, our solution outperforms state-of-the-art open-set recognition solutions in detecting novelties.

As the globalization of semiconductor design and manufacturing processes continues, the demand for defect detection during integrated circuit fabrication stages is becoming increasingly critical, playing a significant role in enhancing the yield of semiconductor products. Traditional wafer map defect pattern detection methods involve manual inspection using electron microscopes to collect sample images, which are then assessed by experts for defects. This approach is labor-intensive and inefficient. Consequently, there is a pressing need to develop a model capable of automatically detecting defects as an alternative to manual operations. In this paper, we propose a method that initially employs a pre-trained VAE model to obtain the fault distribution information of the wafer map. This information serves as guidance, combined with the original image set for semi-supervised model training. During the semi-supervised training, we utilize a teacher-student network for iterative learning. The model presented in this paper is validated on the benchmark dataset WM-811K wafer dataset. The experimental results demonstrate superior classification accuracy and detection performance compared to state-of-the-art models, fulfilling the requirements for industrial applications. Compared to the original architecture, we have achieved significant performance improvement.

Accuracy is an important concern for suppliers of artificial intelligence (AI) services, but considerations beyond accuracy, such as safety (which includes fairness and explainability), security, and provenance, are also critical elements to engender consumers' trust in a service. Many industries use transparent, standardized, but often not legally required documents called supplier's declarations of conformity (SDoCs) to describe the lineage of a product along with the safety and performance testing it has undergone. SDoCs may be considered multi-dimensional fact sheets that capture and quantify various aspects of the product and its development to make it worthy of consumers' trust. Inspired by this practice, we propose FactSheets to help increase trust in AI services. We envision such documents to contain purpose, performance, safety, security, and provenance information to be completed by AI service providers for examination by consumers. We suggest a comprehensive set of declaration items tailored to AI and provide examples for two fictitious AI services in the appendix of the paper.

Anomaly Detection (AD) focuses on detecting samples that differ from the standard pattern, making it a vital tool in process control. Logical anomalies may appear visually normal yet violate predefined constraints on object presence, arrangement, or quantity, depending on reasoning and explainability. We introduce LogicQA, a framework that enhances AD by providing industrial operators with explanations for logical anomalies. LogicQA compiles automatically generated questions into a checklist and collects responses to identify violations of logical constraints. LogicQA is training-free, annotation-free, and operates in a few-shot setting. We achieve state-of-the-art (SOTA) Logical AD performance on public benchmarks, MVTec LOCO AD, with an AUROC of 87.6 percent and an F1-max of 87.0 percent along with the explanations of anomalies. Also, our approach has shown outstanding performance on semiconductor SEM corporate data, further validating its effectiveness in industrial applications.